| Single-Spot Measurements |
Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
|---|---|---|---|---|---|
F3 | Reflectance and film-thickness measurements Features: Compact, low-cost, non-UV systems have 40k-hour light source. * Thickness measurement capability is optional. | ||||
|
F3-s980 | 10-1000 µm * | 960-1000 nm | 10 μm | |
| F3-s1310 | 15-2000 µm * | 1280-1340 nm | 10 μm | ||
| F3-s1550 | 25-3000 µm * | 1520-1580 nm | 10 μm | ||
| In-line Measurements |
Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
|---|---|---|---|---|---|
F32 | Compact solution for in-line measurements Features: Includes spectrometer(s), software, and 10k-hour light source. | ||||
|
F32-s980 | 10-1000 µm * | 960-1000 nm | 10 μm | |
| F32-s1310 | 15-2000 µm * | 1280-1340 nm | 10 μm | ||
| F32-s1550 | 25-3000 µm * | 1520-1580 nm | 10 μm | ||
| Multi-Point Mapping | Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
|---|---|---|---|---|---|
F50 | Measures thickness etc. at two points/second Features: Sample chucks (up to 300mm) sold separately. | ||||
|
F50-s980 | 4-1000 µm | 960-1000 nm | 10 μm | |
| F50-s1310 | 7-2000 µm | 1280-1340 nm | 10 μm | ||
| F50-s1550 | 10-3000 µm | 1520-1580 nm | 10 μm | ||
F60-t | Production-oriented film thickness mapping Features: Includes notch-finding, on-board baselining, and safety interlock. | ||||
|
F60-t-s980 | 4-1000 µm | 960-1000 nm | 10 μm | |
| F60-t-s1310 | 7-2000 µm | 1280-1340 nm | 10 μm | ||
| F60-t-s1550 | 10-3000 µm | 1520-1580 nm | 10 μm | ||